Performance of Large Area Thin-Film CdTe Detector in Diagnostic X-Ray Imaging

Significant advancement in thin-film cadmium telluride (CdTe) deposition techniques in recent years has made this material attractive for the development of low-cost large area detector. Here we evaluate the intrinsic performance of the detector for a range of energies relevant to diagnostic imaging applications, such as fluoroscopy. The input x-ray spectra for a set of tube potentials ranging from 70 to 140 kVp were computed with the tungsten anode spectral model using interpolating polynomials (TASMIP) based on the measured output of our diagnostic x-ray simulator. Frequency-dependent detector performance analysis was conducted through Monte Carlo simulations of energy deposition within the detector. Intrinsic modulation transfer functions (MTF), noise power spectra (NPS), and detective quantum efficiencies (DQE) were computed for a set of CdTe detectors of varying thickness, from 100 to 1000 μm. MTF behavior at higher frequencies was affected by thickness and input energy, NPS increased with film thickness and energy, and the resultant DQE(f) decreased with increasing the input energy, but increased with the thickness of the detector. We found that the optimal thickness of CdTe under diagnostic x-ray beam is in the range of 300 to 600 μm. Physical properties of CdTe, such as the high atomic number and density, used in direct detection configuration, together with the recently established thin-film manufacturing techniques makes this technology a promising photoconductor for largearea diagnostic flat panel imaging.